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MIL

MIL
Test method for ■ second parts Laboratory
The project specification specification name (Chinese)
Standard Test Method for testing of 0 MIL-STD 810F series of environmental engineering conditions and test chamber
1 MIL-STD-810F-500.4 low pressure (altitude)
The 2 MIL-STD-810F-501.4 high temperature
3 MIL-STD-810F-502.4 at low temperature
4 MIL-STD-810F-503.5 temperature shock
5 MIL-STD-810F-504 liquid pollution
6 MIL-STD-810F-505.4 solar radiation (sunlight)
7 MIL-STD-810F-506.4 rain
8 MIL-STD-810F-507.4 humidity
9 MIL-STD-810F-508.5 fungal
10 MIL-STD-810F-509.4 fog
11 MIL-STD-810F-510.4 Sama
12 MIL-STD-810F-511.4 explosive atmosphere
13 MIL-STD-810F-512.4 impregnation
14 MIL-STD-810F-513.5 acceleration
15 MIL-STD-810F-514.5 vibration
16 MIL-STD-810F-515.5 noise
17 MIL-STD-810F-516.4 impact
18 MIL-STD-810F-517 explosion separation shock
19 MIL-STD-810F-518 acidic atmospheric
20 MIL-STD-810F-519 gunfire vibration
21 MIL-STD-810F-520.2 temperature humidity vibration height
22 MIL-STD-810F-521.2 ice / freezing rain
23 MIL-STD-810F-522 ballistic impact
24 MIL-STD-810F-523.2 acoustic vibration / temperature
Measuring 25 MIL-STD-462D electromagnetic interference characteristics
General specification of 26 MIL-S-19500H semiconductor device
27 MIL-STD-750C semiconductor device test method
28 MIL-STD-883E-1004.7 wet resistance
29 MIL-STD-883E-1005.8 steady state life
30 MIL-STD-883E-1006 intermittent life
31 MIL-STD-883E-1010.7 temperature cycling
The 32 MIL-STD-883E-1011.9 heat shock
33 MIL-STD-883E-1015.9 aging test
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