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Keithley3706-S Multimeter
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Product Name:
Keithley3706-S Multimeter
Product Model:
Keithley3706-S
Manufacturer:
Keithley
file:
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Product Description
3706A-S from Keithley is a six slot system switch mainframe. This mainframe contains six slots for plug-in cards in a compact 2U high (3.5inche/89mm) enclosure that easily accommodates the needs of medium to high channel count applications.
Keithley3706-S Multimeter
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Six slot system switch mainframe with optional high performance 7-1/2-digit multimeter
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Multi-processor architecture optimized for high throughput scanning and pattern switching applications
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Remote PC control via Ethernet, USB, and GPIB interfaces
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Up to 576 two-wire or 720 one-wire multiplexer channels in one mainframe
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Up to 2,688 one-pole matrix crosspoints in one mainframe
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Embedded Test Script Processor (TSP®) offering unparalleled system automation, throughput, and flexibility
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TSP-Link® master/slave connection provides easy system expansion and seamless connection to Series 2600 SourceMeter® instruments
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Capable of over 14,000 readings per second to memory with optional high performance multimeter
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LXI Class B with embedded Web browser interface for test setup, maintenance, and basic application control
The Series 3700A offers scalable, instrument grade switching and multi-channel measurement solutions that are optimized for automated testing of electronic products and components. The Series 3700A includes four versions of the Model 3706A system switch mainframe along with a growing family of plug-in switch and control cards.
The Model 3706A/3706A-NFP systems switch with high performance digital multimeter contains six slots for plug-in cards in a compact 2U high (3.5-inch) enclosure that easily accommodates the needs of medium to high channel count applications. When fully loaded, a mainframe can support up to 576 two-wire multiplexer channels for unrivaled density and economical per channel costs. The high performance multimeter provides a tightly integrated switch and measurement system that meets the demanding application requirements in a functional test system or provides the flexibility needed in stand-alone data acquisition and measurement applications.
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