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Keithley 2002 Series: 8½-Digit Multimeter with Scanning
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Product Name:
Keithley 2002 Series: 8½-Digit Multimeter with Scanning
Product Model:
2002
Manufacturer:
Keithley
file:
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Product Description
Keithley 2002 Series: 8½-Digit Multimeter with Scanning Keithley 2002 Series: 8½-Digit Multimeter with Scanning
Keithley 2002 Series: 8½-Digit Multimeter with Scanning
The 8½-digit Model 2002 High Performance Digital Multimeter not only delivers performance specifications usually associated only with instruments that cost thousands more, but it offers a broad range of functions not typically available from DMMs. With 1nV DCV sensitivity and a basic accuracy of 0.0006%, this DMM also offers 18 measurement functions. For greater flexibility a built-in card slot on the rear panel allows an additional multiplexer card for multi-point measurement applications. This DMM provides an excellent choice for production test, design verification, and metrology applications where high accuracy is critical.
Features
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Benefits
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True 8½-digit resolution based on 28-bit A/D converter
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Provides greater dynamic range, avoiding range-shift errors and delays.
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Exceptional measurement integrity combined with high throughput
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Tests precision components quickly and accurately in production environments.
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Keysight 3458A emulation mode
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Saves programming time within existing systems
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Advanced AC measurements including Peak ACV, AC or AC+DC Coupling, RMS or average, and low frequency RMS
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Reduces the number of instruments in your test system.
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Multiple measurement display
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Displays multiple measurements such as DC and AC volts and the AC frequency from a single measurement connection simultaneously Reducing the need for additional instruments.
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Unique single-phase method for 4-wire ohms method
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Allows measuring low resistances twice as fast.
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Optional plug-in switch cards for multipoint measurements
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Simplifies creating a self-contained, multipoint switch and measure solution.
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Built-in bar graph display
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Tracks reading trends around a target value easily saving time from off-line measurement analysis
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