Tektronix’ proven expertise in probes brings you the highest fidelity in high-speed differential probing. The P7350, P7330, and P6330 high-bandwidth differential probes offer excellent signal fidelity, meeting the needs of engineers in design and debug of technologies with very fast clock speeds and edge rates. They provide high-bandwidth, low circuit loading, low-noise differential probing solutions for high-speed circuit designers.
Key performance specifications
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5 GHz to 3.5 GHz bandwidths (typical)
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Low input capacitance:
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≥60 dB (1000:1) Common Mode Rejection Ratio (CMRR) at 1 MHz (P7330, P6330 typical)
Key features
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High-bandwidth, low-noise differential probing
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Small probe head allows easy probing of SMDs
Applications
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Communications (Gigabit Ethernet, Fibre Channel, InfiniBand)
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Semiconductor characterization and validation
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PCI Express
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Serial ATA
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IEEE 1394
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USB 2.0 (The P7350 is not recommended for USB 2.0 compliance testing)
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MIPI® D-PHY
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DDR
The P7330 and P6330 enable users to make time-domain or frequency-domain measurements on high-bandwidth signals commonly found in digital IC designs, communication applications, and disk drive applications. The P7330 and P6330 provide high-bandwidth, low circuit loading, and low-noise differential probing solutions. The small probe head geometry and assorted probe tip accessories allow these probes to easily accommodate manual probing of surface-mount devices.